Defect Inspection System Mujiken+ – NIRECO CORPORATION
A new solution for plain web production
Ultra-high speed monochrome camera and image processing engine.
And software to connect user and engine. Nireco has built up a considerable track record in industrial inspection.
Now, Nireco offers a new solution, the industry top level plain surface inspection system Mujiken+.
Report Abuse
Features
Even faster image processing
An inspection-dedicated high speed processing board enables double the image processing available with conventional systems.
Improved “labelling function” enables accurate length measurement.
Enhanced “shading correction function” and “filter function” to smooth out unevenness and noise.
New inspection algorithm added
New “faint soiling” and “horizontal lines” detection circuits developed to tackle hard to detect unevenness, faint soiling and horizontal lines.
Vertical line detection circuit improved by new streak enhancement processing.
Fuller range of cameras supported, advanced optical systems
Ultra-high speed monochrome camera 640 MHz, 320 MHz (10-bit) also supported, processing speed doubled
Color cameras added to line-up
In addition to LED lamps, also supports combinations of special lighting, such as near-infrared, ultra-violet, etc.
These advanced optical systems increase the range of hidden defects that can be made visible, and greatly improve detection ability.
OS upgraded
Windows 7 Embedded. Allows high speed data processing.
The use of optical communications has allowed for significantly simpler hardware design. This has led to a dramatic improvement in PC reliability.
Twin monitors supported
Increased external monitors enables enlarged display of defect images.
Monitors mounted at operator observation point to enable quick detection of trouble.
Inspection samples
Speedy data analysis
Highly accurate detection of defects that are difficult to spot in plain materials such as high function film, ordinary film, paper, foil, etc.
Monochrome images photographed at high speed are processed with a unique algorithm and defect sections displayed. Defect sections are labelled in order to prevent defective products from being passed on to the next stage.
Defect inspection screens
Defect inspection screen
Grouping by statistical analysis
Twin monitors supported
Component of Mujiken+
Technology & Trust
Business Overview Process control
Electro-hydraulic Actuator
Eddy Current Level Meter
Thickness Measuring Systems
Edge Position Control Systems(metal industry related)
Automatic Marking Systems
Web Control
Edge Position Control Systems(printing,film-related)
Tension Control Systems
Automatic Register Control Systems
Print-to-cut Register Control Systems
Printing Quality Inspection Systems
Gluing Control Systems
Inspection Systems
Defect Inspection System for Plain Surfaces
Pouch Packaging Inspection Systems
Near-infrared Ray Analysis Systems
Image Processing and Analysis Systems
Fruit and Vegetable Quality Analysis Systems
Optics
Laser Devices
Supplier Information
- Store Name: NIRECO CORPORATION
- Vendor: NIRECO CORPORATION
- Address: 192-8522
Tokyo Hachioji-shi 2951-4 Ishikawa-machi
- Testing Equipment, Testing Instrument & Equipment
NIR Spectral Analyzer A8860 (for liquid) – NIRECO CORPORATION
Testing Equipment, Testing Instrument & EquipmentNIR Spectral Analyzer A8860 (for liquid) – NIRECO CORPORATION
This Near Infrared (NIR) spectral analyzer was developed based on our over 40 years of accumulated sales experience.
It provides the features required for laboratory analysis and has been perfected with our proprietary technology. Various features, such as the sampling system that meets the diverse demands of measurement in laboratories, deliver excellent cost performance and top-class capabilities.The wide-scan monochromator with its large diffraction grating enables high-quality spectroscopic measurements in the wavelength range of 400-2500 nm. The sample temperature can be adjusted up to 60°C for each cell in the instrument, and the autosampler mechanism allows continuous measurement of two samples.
SKU: n/a - Testing Equipment, Testing Instrument & Equipment
Electrode Sheet Inspection System Mujiken-RB – NIRECO CORPORATION
Testing Equipment, Testing Instrument & EquipmentElectrode Sheet Inspection System Mujiken-RB – NIRECO CORPORATION
The new board and new camera enable up to 4 times faster line speed and higher resolution inspection.
the measuring function achieves higher accuracy and has both the productivity and accuracyrequired for electrode sheet production lines.
SKU: n/a - Testing Equipment, Testing Instrument & Equipment
Defect Inspection System Mujiken Express – NIRECO CORPORATION
Testing Equipment, Testing Instrument & EquipmentDefect Inspection System Mujiken Express – NIRECO CORPORATION
High grade model of the Mujiken series is now available!
High-speed, high-capacity image processing engine (twice as fast as our previous model)
Newly equipped with a GPU! High speed inspection, various image processing
High speed inspection (640MHz) with CoaXPress (Japan Industrial Imaging Association standard) camera
Long distance and high speed communication without relay board (Max. 680MHz, 50m)SKU: n/a - Testing Equipment, Testing Instrument & Equipment
NIR Spectral Analyzer A8850 (for solids and powders) – NIRECO CORPORATION
Testing Equipment, Testing Instrument & EquipmentNIR Spectral Analyzer A8850 (for solids and powders) – NIRECO CORPORATION
This Near Infrared (NIR) spectral analyzer was developed based on our over 40 years of accumulated sales experience.
It provides the features required for laboratory analysis and has been perfected with our proprietary technology. Various features, such as the sampling system that meets the diverse demands of measurement in laboratories, deliver excellent cost performance and top-class capabilities.The wide-scan monochromator with its large diffraction grating enables high-quality spectroscopic measurements in the wavelength range of 400-2500 nm. In addition, the sample box is equipped with an XY-movable multi-purpose stage for flexible measurement methods linked to the spectroscopic measurements.
SKU: n/a
Related products
- Hast Chamber, Testing Equipment, Testing Instrument & Equipment
Temperature & Humidity Chambers SE – KATO INC.
Hast Chamber, Testing Equipment, Testing Instrument & EquipmentTemperature & Humidity Chambers SE – KATO INC.
Full implementation of the intelligent chamber concept.
A standard model that is fully equipped and can be used for a wide range of applications.
Professional model with necessary functions and ease of use.SKU: n/a - Hast Chamber, Testing Equipment, Testing Instrument & Equipment
Rapid-Rate Thermal Cycle Chamber – ESPEC CORP.
Hast Chamber, Testing Equipment, Testing Instrument & EquipmentRapid-Rate Thermal Cycle Chamber – ESPEC CORP.
High temperature rate of change with uniformity and reproducibility
The Rapid-Rate Thermal Cycle Chamber is ideal for test requiring quick changes 15°C/min ramp rate in specimen temperature and 23°C/min ramp rate for air temperature(temperature heat up average). It covers various applications from JEDEC, IEC standards to screening.
It features a built-in web application that can be used to operate the chamber from a PC or tablet.
This web application allows you to check the status of the chamber remotely using a web browser.SKU: n/a - Hast Chamber, Testing Equipment, Testing Instrument & Equipment
Rapid-Rate Heating & Cooling Temperature Chambers ML – KATO INC.
Hast Chamber, Testing Equipment, Testing Instrument & EquipmentRapid-Rate Heating & Cooling Temperature Chambers ML – KATO INC.
Rapid temperature rise and fall of 5°C/minute enables testing and evaluation over a wide range.
Fully compliant with MIL-STD-781 standard
Rapid temperature rise and fall standard modelSKU: n/a - Hast Chamber, Testing Equipment, Testing Instrument & Equipment
Highly Accelerated Stress Test System (HAST Chamber) – ESPEC CORP.
Hast Chamber, Testing Equipment, Testing Instrument & EquipmentHighly Accelerated Stress Test System (HAST Chamber) – ESPEC CORP.
Creates tempreture, humidity and pressure environments to IEC60068-2-66 standard.
The Highly Accelerated Stress Test Chamber has been primarily developed to conduct bias testing which applies constant voltage and signals. The standard equipment features two control modes: [unsaturated control] and [wet saturated control], while the M-type chamber additionally offers a [wet and dry bulb temperature control] mode.
The M-type chamber conforms to the IEC60068-2-66 standard.SKU: n/a
