Impulse Noise Simulator (semi-conductor type) INS-S220 / S420 – NoiseLaboratoryCo.Ltd.

Features

• Button touch instead of coaxial cable replacing reduces pulse width setting time.
• Pulse waveform stability has improved, allowing highly-reproducible testing.
• Consumable parts reduction cut down running cost.
• Common mode/normal modes are easily switched between by a short plug.
• “Test time setting” new function simplifies test time setting.
• Wiring became easier thanks to a built-in 50Ω terminator resistor design.
• Repetition cycle became faster. Due to high repetition, malfunction occurrence rate is up and test time is shortened.(only INS-S220)
• Outlet Panel allows direct connection of EUT AC plug.(option)
• Various tests are available by using different probes and coupling clamps.(option)
• Using of external CDN allows testing to 3-phase EUTs.(option)
• Dedicated software simplifies testing with various test conditions (option, applicable to INS-S420 only)

To solve the trouble in the market Test pulse with adjustable high frequencies and energy volume

Narrow pulse of 50-100ns width although contains small energy, greatly affects electric circuits due to two transient fluctuations of short-time rise and fall and inductive coupling by steeply generated electromagnetic field.
Wide pulse of 800ns-1000ns contains more energy, making it easy to apply large voltage fluctuations to the circuit.
The rise time of impulse simulator is faster than IEC61000-4-4 fast transient/burst test and contains high frequency components up to 1GHz.
Therefore, when noise is applied to the EUT, it is easier to penetrate and affect the electronic circuit.
In addition, since the included frequency spectrum components and intensity differ depending on the pulse width of the impulse, it is recommended to conduct tests with several types of pulse widths.

Improved reproducibility of test results Allows for more quantitative testing

By changing from the conventional mercury relay to the semiconductor relay, the stability of the test pulse waveform has been improved, enabling tests with more quantitative and highly reproducible test results than before. In addition, the output waveform defect occurring with the mercury relay deterioration has been eliminated.

Improved malfunction occurrence rate Contributes to testing time reduction

By speeding up the test pulse repetition period compared to old models,product malfunction occurrence rate should increase contributing to overall test time reduction.

Example : In case the repetition cycle is 2ms

Pulse Widthsetting simplified Setting time reduced

Pulse width setting in old models (INS-4020/4040) required troublesome manual cable connection switching. New Impulse Noise Simulator models INS-S220/S420 setting is simple by pushing buttons, reducing setting time and helping avoid connection errors.

Connection simplified Connection time reduced

Outlet panel was adopted for easy EUT connection. By using an outlet panel (optional) matching the shape of each country, you can easily connect EUT for the test.

Operating Cost reduction Consumable parts reduced

Adopted semiconductor type relay instead of old mercury type relay (consumable).
Consumables such as pulse width setting cables and mercury relays are no longer required, reducing replacement costs.

Easy Noise countermeasurement Identify the malfunction location

A large number of noise application options are available for power lines, communication lines, harnesses, housings, and board levels, making it easy to identify malfunction locations.